Fast non-destructive precise karat/Percentage determination of Jewellery Samples using microspot XRF technology

Karatmeter ORA, a tabletop spectrometer is a fast, non-destructive and accurate tool for measurement of precious metals & finished jewellery. With its compact size, it comfortably fits into small space.

Based on several decades of research, analysis & experience in the field of microspot X-ray technology, Bruker-AXS Microanalysis GmbH, Germany, has designed & developed OEM kits for karatmeter ORA taking into consideration the latest innovations in X-ray techniques. Bruker-AXS is a worldwide leader in providing advanced X-ray systems & complete solutions for structure & elemental analysis using X-ray fluorescence (XRF) & other sophisticated techniques.

The unit precisely & quickly determines the elemental composition of jewellery alloys from Z-22 (Ti) & upwards. It successfully determines the elemental composition of all gold alloys, platinum group metals & silver alloys, even without the assistance of any technically skilled personnel.

Excitation from top and a small spot size down to 0.3/0.5mm allows a contact-less & non-destructive analysis of even intricately shaped samples. Specimens upto the size of 100X100X100mm can be placed directly on the sample stage & examined without further preparations, where the final positioning is supported by an image through optical microscope.

At Quantum Equipment, we are continuously improving & innovating on the established techniques in precious metal analysis.

The detection of fluorescence radiation by a prop counter offers a large sensitive area, thereby capturing a large amount of fluorescence which is vital for precise analysis of metals. Elements above 0.5% concentrations can be quantified with standard-based or standard-less calibrations. This not only supports high accuracy in the range of 0.2 wt. % but also the analysis of unknown elements.
Parameter Karatmeter ORA
Excitation Micro-focus, high performance, W-target, thin glass window X-ray tube
High voltage 40kV/1.0mA (40W) application optimized
Detector High resolution gas filled prop-counter with large sensitive window area, auto temperature compensation with environment
Spot size 0.3mm or 0.5mm fixed collimator
Sample stage Manual scissors type z-stage, 110mm travel, 1kg maximum load
Quantification Standard-based Empirical model using several assayed samples Fundamental Parameter model for standard-less analysis
Power supply 110/230VAC, 50/60Hz, 100W
Dimensions 370 X400 X330mm (WXDXH)
Weight 26 kg

XSpect analytical software suite

The XSpect software provided you with the following functionality:

Instrument control, data acquisition and management Peak identification, de-convolution and spectrum analysis

Quantitative composition analysis, standard-based Empirical and standard-less Fundamental Parameter calibration models

Report generator, statistical data control, storage & printing

* All configurations and specifications are subject to change without notice.

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