|
Fast non-destructive precise Karat/Percentage determination fo precious metals and layer thickness using microspot XRF technology |
|
Based on several decades of research, analysis & experience in the field of microspot X-ray technology, Bruker-AXS Microanalysis GmbH, Germany, has designed & developed OEM kits for karatmeter MISTRAL taking into consideration the latest innovations in X-ray techniques. Bruker-AXS is a worldwide leader in providing advanced X-ray systems & complete solutions for structure & elemental analysis using X-ray fluorescence (XRF) & other sophisticated techniques.
The unit precisely & swiftly determines the percentage by weight (or karat) in a solid piece of jewellery, precious coins or any other piece of noble metal making use of the X-ray assay technique. It successfully determines the elemental composition of all gold alloys, platinum group metals & silver alloys. The analysis of bulk materials & layers is non-contact, non-destructive without any requirement for sample preparations. |
|
 |
|
|
The piece of interest may simply be positioned with the aid of video microscope & commence with measurements. |
|
Karatmeter MISTRAL comes with two different X-ray detectors, either a large sensitive area gas-filled prop counter for standard applications in quality control or a silicon drift detector (SDD) with superior speed & energy resolution, to drive detection limits down to 0.01wt. %. These detectors, digital pulse processing & optimized geometrical conditions confirms maximum efficiency in X-ray quanta detections & further fast analysis |
|
At Quantum Equipment, we are continuously improving & innovating on the established techniques in precious metal analysis. Whether you want to control the quality of a sample against known standard or determine the composition of an unknown material, the XSpect analytical software provides the right tool for the purpose of quantification for both bulk material & layer systems. |
|
asdsadsad |
|
| Parameter |
Karatmeter MISTRAL (PC) |
Karatmeter MISTRAL (SDD) |
| Excitation |
Micro-focus, high performance, W-target, thin glass window X-ray tube |
Micro-focus, high performance, W-target, thin Be-window X-ray tube |
| High voltage |
40kV/1.0mA (40W) application optimized |
50kV/1.0mA (50W) with programmable HV controls for application optimization |
| Detector |
High resolution gas filled prop-counter with large sensitive window area, temp.
compensation with environment |
Prltier cooled high performance XFlash silicon drift detector (SDD) with 30mm active area, high energy resolution better than 160eV |
| Spot size |
0.3mm or 0.5mm fixed collimator |
0.13 to 0.7mm through 4-position motorized collimator changer |
| Sample view |
USB based high resolution color CCTV camera with multiplexed graphics, 20x to 40x magnification |
USB based high resolution color CCTV camera with multiplexed graphics, 20x to 40x magnification |
| Quantification |
Standard-based Emporical model using several assayed samples, Fundamental Parameter model for standard-less analysis |
Standard-based Empirical model, Fundamental Parameter model for standard-less bulk analysis and FP-based coating thickness analysis model |
| Power supply |
110/230VAC, 50/60Hz, 100W |
110/230VAC, 50/60Hz, 120W |
| Dimensions (W x D x H) |
465 X 670 X 380mm (WxDxH) |
465 X 670 X 380mm (WxDxH) |
| Weight |
36 kg |
40 kg |
|
|
XSpect analytical software suite |
 |
Instrument control, data acquisition and management |
|
|
Peak identification, de-convolution and spectrum analysis |
|
|
Quantitative composition analysis, standard-based Empirical and standard-less Fundamental Parameter calibration models |
|
|
Analysis of coating systems regarding layer thickness and composition |
|
|
Editor for designing of specific layer analysis applications using FP-calculations |
|
|
Report generator, statistical data control, storage & printing |
|
|
 |
|
|
* All configurations and specifications are subject to change without notice. |
|
|
|
|
