A universal coating thickness & material analyser designed for the inspection of electronic components and other precision parts

The ComPact 5/pin offers a universal material & coating thickness analyser at a reasonable price/performance ratio. The use of a high resolution silicon semiconductor detector makes the ComPact 5/PIN an ideal tool for users who want best limits of detection and highest precision together with maximum flexibility. Compared with a conventional prop – counter the semiconductor detector offers about 4 times better separation of overlapping elements. The much higher peak to background ratio of the detector allows the analysis of very thin coatings, 10 times thinner as so far possible and also fast analysis due o latest digital signal measuring technique.

A very comprehensive library of software tools allows the analysis of bulk as well as liquid samples (plating bath), multiple layer alloy coatings on complex base material can be analysed. This makes the ComPact 5/PIN the ideal tool for electronic industry and modern laboratory.

The motorized z-stage with auto focus allows easy sample positioning. The programmable XYZ sample stage configuration facilities automatic measurement sequences even for very small samples.

Specifications
X-Ray Tube : Standard : Mini-focus high performance, W-target, 0.5mm spot size.
Option : Micro-focus, high performance Be-window, 85µm spot size (with filter changer option).
Tube Power : 25-50kV / 1.2mA (60W), with automatic voltage selections for applications optimization.
X-Ray Detection : Peltier cooled silicon semiconductor detector (PIN-diode), 25mm active area, Be-thin entrance window, high energy resolution better than 200eV (FWHM at 5.9keV).

Collimator Configurations:-

Single : 0.3mm Ø or 0.5mm Ø
Collimator Changer : Optional four positions, programmable and motorized. Customized Collimator sizes from 0.075mm through 1.0mm

Stage Configurations:-
Z – stage : Motorized linear z-stage, 60mm travel, 5kg maximum load.
XYZ – stage : Motorized, Programmable “Easy Load” stage, X-100mm, Y-80mm & Z-60mm travel and 5 kg maximum load (20kg optional)
Top-Plate : 240 x240mm

Sample Positioning:-

Joy-stick real operational movement, point & shoot, auto-focus facility (laser pointer optional).

Sample View:-

Colour CCTV video microscope with multiplexed graphics, video signal for single-screen operation, 50x magnification, 4 x 3 mm field view, computer generated cross-hair with beam size indicator.

Filtering:-

Software controlled detector filter changer, Co foil or applications configured, primary filter changer in conjunction with Be-window.

General:-

450 x 400 x 650mm (HxWxD), 46kg, 230VAC/50Hz

Measurement Performance Features:-

Automatic application recognition.

Applications and standards library

Numerical filtering package with peak deconvolution

Optimized for RoHS, WEEE and ELV standards measurements

Chamber Performance Capability:-

Compact sample chamber accommodates a wide variety of parts in an economical footprint.

2048 channel multi-channel analyser.

Real-time hardware diagnostic monitoring.

Applications Performance Capability:-

Fundamental parameters and empirical calibration modes

Excitation mode, absorption mode, linear mode (for thin coating). Relative mode for focus free measurement.

Simultaneous measurement of single, double and triple layer coatings.

Simultaneous measurement of thickness and composition of alloy coatings.

Base material and coating density correction.

Statistical functions with mean value, standard deviation, low/high reading, trend line, Cp and Cpk factors.

20-element general qualitative simultaneous element determination

Spectrum analysis for semi-quantitative concentration measurement.

Software Tools:-

X-MasteR : XRF analysis system running under Microsoft WindowsTM offers:

Integrated statistics package

Integrated data file management system stores measurements statistics. (Optional)

Report generation and storage. (Optional)

Spectra and video .bmp format storage.

On-line result export (RS 232) after each measurement.

Network compatible (Ethernet or Novell)

X-MasteR Available Modules:-
µ-MasteR Evaluation module for coating thickness measurement.
%-MasteR Precise quantitative material analysis for up to 8 elements simultaneously.
Fun-MasteR Universal Calibration module using fundamental parameter for standard free measurements
Element-MasteR Standard less qualitative and quantitative material analysis for up to 20 elements.
Liquid-MasteR Plating bath solution analysis.
Report-MasteR Software module for stage programming and auto analysis with desired sequence.
Data-MasteR Database and statistics software with long term documentation
Stage-MasteR Software modules for stage programming and auto analysis with desires sequence.

* Technical specifications are subject to change without prior notice

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