A universal X-ray coating thickness measurement and material analysis system designed for the Inspection of electronic components, PCB’s and other precision metal finishing applications
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The ComPact 5 is an excellent choice when coating thickness measurement and material analysis applications demand high precision and versatility |
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Single, binary and ternary coating thickness applications are measured precisely and non-destructively. Coating thickness and alloy composition can be analysed simultaneously. The ComPact 5 can also determine primary metals concentration in plating bath solutions & perform substrate sorting of pre-plated stock. |
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The compact chamber, together with an optimised X-ray beam geometry allows the use of very small collimators. A software controlled optional multiple position collimator changer in conjunction with programmable X-ray tube power provides versatility to adapt the system to almost any application. |
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The programmable XYZ sample stage configuration facilitates automatic measurement sequences, making the ComPact 5 and ideal tool for the electronics and telecommunication industries, as well as for precision metal finishing applications. |
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Key Features:- |
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Alloy thickness and composition measurement for the precision metal finishing, microelectronics, and telecommunications industries. |
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Micro-mechanical collimation with optimised high voltage selection |
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Motorized z-stage with auto focus facility joy-stick controlled. |
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Auto-selected primary and secondary filtering mechanics |
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Substrate sorting by X-ray assay (stainless steel and other ferrous and non-ferrous alloy determinations). |
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| X-Ray Tube : |
Standard : Mini-focus high performance, W-target, 0.5mm spot size. Option : Micro-focus, high performance Be-window, 85µm spot size (with filter changer option). |
| Tube Power : |
25-50kV / 1.2mA (60W), with automatic voltage selections for jewellery optimization. |
| X-Ray Detection : |
Gas filled proportional counter. |
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Collimator Configurations:- |
Single : 0.3mm Ø or 0.5mm Ø
Collimator Changer : Optional four positions, programmable and motorized. Customized Collimator sizes from 0.075mm through 1.0mm |
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Stage Configurations:- |
| Z – stage : |
Motorized linear z-stage, 60mm travel, 5kg maximum load. |
| XYZ – stage : |
Motorized, Programmable “Easy Load” stage, X-100mm, Y-80mm & Z-60mm travel and 5 kg maximum load (20kg optional) |
| Top-Plate : |
240 x240mm |
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Sample Positioning:- |
Joy-stick real operational movement, point & shoot, auto-focus facility (laser pointer optional). |
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Sample View:- |
Colour CCTV video microscope with multiplexed graphics, video signal for single-screen operation, 50x magnification, 4 x 3 mm field view, computer generated cross-hair with beam size indicator. |
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Filtering:- |
Software controlled detector filter changer, Co foil or applications configured, primary filter changer in conjunction with Be-window. |
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General:- |
450 x 400 x 650mm (HxWxD), 46kg, 230VAC/50Hz |
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Measurement Performance Features |
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Automatic application recognition. |
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Applications and standards library |
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Numerical filtering package with peak deconvolution |
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Chamber Performance Capability:- |
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Compact sample chamber accommodates a wide variety of parts in an economical footprint. |
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2048 channel multi-channel analyser. |
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Real-time hardware diagnostic monitoring. |
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Applications Performance Capability:- |
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Fundamental parameters and empirical calibration modes |
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Excitation mode, absorption mode, linear mode (for thin coating). Relative mode for focus free measurement. |
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Simultaneous measurement of single, double and triple layer coatings. |
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Simultaneous measurement of thickness and composition of alloy coatings. |
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Base material and coating density correction. |
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Statistical functions with mean value, standard deviation, low/high reading, trend line, Cp and Cpk factors. |
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20-element general qualitative simultaneous element determination |
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Spectrum analysis for semi-quantitative concentration measurement. |
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Software Tools |
X-MasteR : XRF analysis system running under Microsoft WindowsTM offers:
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Integrated statistics package |
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Integrated data file management system stores measurements statistics. (Optional) |
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Report generation and storage. (Optional) |
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Spectra and video .bmp format storage. |
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On-line result export (RS 232) after each measurement. |
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Network compatible (Ethernet or Novell) |
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X-MasteR Available Modules: |
| µ-MasteR |
Evaluation module for coating thickness measurement. |
| %-MasteR |
Precise quantitative material analysis for up to 8 elements simultaneously. |
| Fun-MasteR |
Universal Calibration module using fundamental parameter for standard free measurements |
| Element-MasteR |
Standard less qualitative and quantitative material analysis for up to 20 elements. |
| Liquid-MasteR |
Plating bath solution analysis. |
| Data-MasteR |
Database and statistics software with long term documentation |
| Report-MasteR |
Software module for stage programming and auto analysis with desired sequence. |
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* Technical specifications are subject to change without prior notice |
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